Nanoscale Characterisation of CuInGaSe2/CdS Structures Grown by Pulsed Electron Deposition
نویسندگان
چکیده
منابع مشابه
Microscopic characterisation of suspended graphene grown by chemical vapour deposition.
We present a multi-technique characterisation of graphene grown by chemical vapour deposition (CVD) and thereafter transferred to and suspended on a grid for transmission electron microscopy (TEM). The properties of the electronic band structure are investigated by angle-resolved photoelectron spectromicroscopy, while the structural and crystalline properties are studied by TEM and Raman spectr...
متن کاملHighly conductive nanoclustered carbon:nickel films grown by pulsed laser deposition
An enhancement by 5 orders of magnitude of the electrical conductivity of nanoclustered carbon films is reported by incorporation of metallic atoms, but without significant morphological changes. Films were deposited by 248 nm pulsed laser ablation of both a pyrolytic graphite target and a mixed carbon-nickel (C:Ni) target, and structural analysis revealed that similar film morphologies were ob...
متن کاملStoichiometric Magnetite Grown by Infrared Nanosecond Pulsed Laser Deposition
Pulsed laser deposition (PLD) is a versatile technique for the fabrication of nanostructures due to the possibilities it offers to control size and shape of nanostructured deposits by varying the laser
متن کاملInGaN channel high electron mobility transistor structures grown by metal organic chemical vapor deposition
High electron mobility transistor (HEMT) structures of AlInGaN/AlN/InGaN/GaN were grown by metal-organic chemical vapor deposition. A combination of low growth rate and high growth temperature during synthesis of the InGaN channel layer led to significant improvement in HEMT electron transport properties. The improvement was correlated with an evolution of both surface roughness and photolumine...
متن کاملEffects of Thickness Variation on Properties of ZnO Thin Films Grown by Pulsed Laser Deposition
Grown by Pulsed Laser Deposition Jae-Min MYOUNG1, Wook-Hi YOON, Dong-Hi LEE, Ilgu YUN, Sang-Hyuck BAE and Sang-Yeol LEE Information and Electronic Materials Research Laboratory, Department of Materials Science and Engineering, Yonsei University, 134 Shinchon-Dong, Seodaemun-Gu, Seoul 120-749, Korea Department of Electrical and Electronic Engineering, Yonsei University, 134 Shinchon-Dong, Seodae...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2010
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927610059271